Source: Cox, W.J. 1997. Corn silage and grain yield responses to plant densities. J. Prod. Agric. 10: 405-409.

This article analyzes and discusses the results of a study about how plant densities of corn silage and grain affect yield. By examining the affect of density on yield, one may discover how sustainability, in terms of greater output, can be increased. Experiments were conducted in New York State in 1992 and 1993, which had very different weather conditions. In both experiments crops were planted on soils typical for the region. The different hybrids were analyzed at populations that encompass current recommendations. In 1992, favorable moisture conditions caused fairly high silage and grain yields. Both were very similar in their response to environmental factors leading to the conclusion that on well-drained soils, like those used in this study, plant density recommendations should be the same for both silage and grain. One drawback noted was that as densities increased, feed quality tended to decrease, necessitating earlier harvest. The presence or absence of corn grain affected the optimal population for a particular corn hybrid but the grain moisture content and test weight were not so important. In 1993, very dry conditions caused much lower yields in both grain and silage. In this type of weather, the best silage densities were greater than those of grain. Hybrids had more variability for optimum density in these conditions than in the previous year, and a decrease in average yields was noted. This suggests that growers should lower their seeding rates in years when low moisture is expected to limit corn yields. From the data derived from this research, one can conclude that current population recommendations are too low and need to be increased by approximately ten percent. Density of planting had a direct affect on both crops, but it primarily affected quality rather than quantity. This raises the question of whether or not measures to produce greater yields are worth the decrease in quality levels.

Abstract author: David A. Asam, 2 November 1998.

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